Title :
Amplitude detecting micromechanical resonating beam magnetometer
Author :
Kang, J.W. ; Guckel, H. ; Ahn, Y.
Author_Institution :
Solid State Electron. Center, Honeywell Inc., Plymouth, MN, USA
Abstract :
A highly sensitive magnetometer is demonstrated using a resonant amplitude detection method in an integrated vacuum encapsulated resonant microbeam which has a very high quality factor (Q). The magnetic field is efficiently converted to mechanical vibrations of the high Q microbeam by using the Lorentz force between a beam current and the applied magnetic field. The mechanical vibration causes an optical modulation during the transmission of the light through the layers of the resonator. The modulated light produces an electronic output signal at an embedded photodiode just below the microbeam. The optical detection of the beam vibration allows a simple resonator structure and good output signal isolation from the input current leading to a less noisy output. Measured Q-values of the fabricated devices are above 50,000 with die yield exceeding 90%. Measured magnetic sensitivities near 55,000 V/ATesla are much higher than those reported for Hall effect devices
Keywords :
Q-factor; elemental semiconductors; magnetic sensors; micromechanical resonators; microsensors; optical modulation; silicon; vibrations; Hall effect devices; Lorentz force; Si; beam current; electronic output signal; embedded photodiode; high Q microbeam; integrated vacuum encapsulated resonant microbeam; magnetic field; magnetic sensitivities; mechanical vibration; mechanical vibrations; microbeam; micromechanical resonating beam magnetometer; modulated light; optical detection; optical modulation; output signal isolation; quality factor; resonant amplitude detection; resonator structure; Lorentz covariance; Magnetic fields; Magnetic resonance; Magnetometers; Micromechanical devices; Optical modulation; Optical resonators; Photodiodes; Q factor; Vibrations;
Conference_Titel :
Micro Electro Mechanical Systems, 1998. MEMS 98. Proceedings., The Eleventh Annual International Workshop on
Conference_Location :
Heidelberg
Print_ISBN :
0-7803-4412-X
DOI :
10.1109/MEMSYS.1998.659785