Title :
Robust Logistic Principal Component Regression for classification of data in presence of outliers
Author :
Wu, H.C. ; Chan, S.C. ; Tsui, K.M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
Abstract :
The Logistic Principal Component Regression (LPCR) has found many applications in classification of high-dimensional data, such as tumor classification using microarray data. However, when the measurements are contaminated and/or the observations are mislabeled, the performance of the LPCR will be significantly degraded. In this paper, we propose a new robust LPCR based on M-estimation, which constitutes a versatile framework to reduce the sensitivity of the estimators to outliers. In particular, robust detection rules are used to first remove the contaminated measurements and then a modified Huber function is used to further remove the contributions of the mislabeled observations. Experimental results show that the proposed method generally outperforms the conventional LPCR under the presence of outliers, while maintaining a performance comparable to that obtained under normal condition.
Keywords :
data handling; pattern classification; principal component analysis; regression analysis; Huber function; LPCR; data classification; high-dimensional data; microarray data; outliers presence; robust logistic principal component regression; tumor classification; versatile framework; Accuracy; Classification algorithms; Eigenvalues and eigenfunctions; Logistics; Measurement uncertainty; Pollution measurement; Robustness;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6271894