• DocumentCode
    3021344
  • Title

    VLSI implementation of an 855 Mbps high performance soft-output K-Best MIMO detector

  • Author

    Ju, Chunhui ; Ma, Jun ; Tian, Chengzhi ; He, Guanghui

  • Author_Institution
    Sch. of Microelectron., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2012
  • fDate
    20-23 May 2012
  • Firstpage
    2849
  • Lastpage
    2852
  • Abstract
    Multiple-input multiple-output (MIMO) technique can significantly increase data throughput without sacrificing additional bandwidth. However, data detection at the receiver and its VLSI implementation is challenge due to high computation complexity. This paper presents the VLSI architecture and implementation for a 4×4 64-QAM soft-output K-Best MIMO detector. A novel deeply pipelined architecture which makes use of all the full-length ZF-augmented discarded paths (DPs) is designed to reduce complexity and improve BER performance. Furthermore, to save area and latency, two improvement methods-abandoning DPs of bottom levels and performing ZF-augmentation at the last stage are proposed. The presented detector improves the BER performance by 2.3dB at BER=10-3 compared to the conventional soft K-Best scheme when using the minimum mean squared error-sorted QR decomposition (MMSE-SQRD). It can achieve a peak throughput of 855 Mbps while consuming 223K gates, 301pJ/bit and 102 cycles for latency in SMIC 0.13μm CMOS process.
  • Keywords
    CMOS integrated circuits; MIMO communication; error statistics; quadrature amplitude modulation; 64 QAM; BER performance; SMIC CMOS process; VLSI implementation; bit rate 855 Mbit/s; full length ZF augmented discarded path; minimum mean squared error sorted QR decomposition; multiple input multiple output technique; size 0.13 mum; soft output K-best MIMO detector; Bit error rate; Complexity theory; Detectors; MIMO; Measurement; Throughput; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
  • Conference_Location
    Seoul
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-0218-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2012.6271905
  • Filename
    6271905