Microwave noise parameters of HEMTs vs. temperature by a simplified measurement procedure

The performance of microwave noise parameters of HEMTs vs. temperature has been investigated by applying a new simplified measurement procedure, such method relies on the extraction of a noisy circuit model from measured scattering parameters together with one noise figure measurement in input matched conditions, (namely, F₅₀ ). Then the four noise parameters of the device under test are extracted using a suitable computer-aided model analysis. Further investigation have been carried out to verify the reliability of the prediction of F₅₀ values vs. temperature by means a simple noise temperature ratio