Title :
REDW 2008 [Title page]
Abstract :
The following topics were dealt with: ionizing radiation effects; single event effects; radiation hardening; dose rate upset investigation; soft errors; laser beam effects; low dose rate testing; dosimetry; spacecraft electronics; memory circuits and total ionizing dose response.
Keywords :
dosimetry; integrated memory circuits; laser beam effects; radiation hardening (electronics); space vehicle electronics; dose rate upset investigation; dosimetry; ionizing radiation effects; laser beam effects; low dose rate testing; memory circuits; radiation hardening; single event effects; soft errors; spacecraft electronics; total ionizing dose response;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.1
