DocumentCode
3021761
Title
Fiber-free Characterization of Photonic Integrated Circuits by Thermoreflectance Microscopy
Author
Farzaneh, M. ; Hudgings, Janice A. ; Ram, Rajeev J.
Author_Institution
Mount Holyoke Coll., South Hadley
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
We demonstrate the use of amplified spontaneous emission in thermoreflectance imaging of photonic integrated circuits for fiber-free characterization of the integrated cascaded semiconductor optical amplifiers.
Keywords
infrared imaging; integrated optics; optical microscopy; optical testing; semiconductor optical amplifiers; superradiance; thermoreflectance; amplified spontaneous emission; cascaded semiconductor optical amplifiers; fiber-free characterization; integrated semiconductor optical amplifiers; photonic integrated circuits; thermoreflectance imaging; thermoreflectance microscopy; Integrated optics; Optical fiber devices; Optical fiber testing; Optical microscopy; Optical surface waves; Photonic integrated circuits; Semiconductor optical amplifiers; Stimulated emission; Temperature; Thermoreflectance;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/CLEO.2007.4453493
Filename
4453493
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