DocumentCode
3021924
Title
Results of Single-Event Transient Measurements Conducted by the Jet Propulsion Laboratory
Author
Irom, Farokh ; Miyahira, Tetsuo F.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
fYear
2008
fDate
14-18 July 2008
Firstpage
58
Lastpage
63
Abstract
This paper reports recent single-event transient results for a variety of microelectronic devices that include differential line receivers, drivers and transceiver. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Keywords
analogue integrated circuits; driver circuits; integrated circuit measurement; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; transceivers; transients; Jet Propulsion Laboratory; NASA spacecraft; analogue single-event transient measurement; differential line receiver; driver; microelectronic devices; transceiver; Circuit testing; Cyclotrons; Driver circuits; Ion beams; Laboratories; NASA; Propulsion; Space technology; Test facilities; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location
Tucson, AZ
Print_ISBN
978-1-4244-2545-7
Type
conf
DOI
10.1109/REDW.2008.17
Filename
4638615
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