Title :
Results of Single-Event Transient Measurements Conducted by the Jet Propulsion Laboratory
Author :
Irom, Farokh ; Miyahira, Tetsuo F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
This paper reports recent single-event transient results for a variety of microelectronic devices that include differential line receivers, drivers and transceiver. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Keywords :
analogue integrated circuits; driver circuits; integrated circuit measurement; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; transceivers; transients; Jet Propulsion Laboratory; NASA spacecraft; analogue single-event transient measurement; differential line receiver; driver; microelectronic devices; transceiver; Circuit testing; Cyclotrons; Driver circuits; Ion beams; Laboratories; NASA; Propulsion; Space technology; Test facilities; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.17
