Title :
A Radiation Hardened High Voltage 16:1 Analog Multiplexer for Space Applications (NGCP3580)
Author :
Adams, Dennis A. ; Barnes, Herbert A. ; Fitzpatrick, Michael D. ; Goldstein, Norman P. ; Hand, William L. ; Jackson, William L. ; Koga, Rocky ; Pennock, Michael B. ; Remenapp, Henry J. ; Smith, Joseph T.
Author_Institution :
Northrop Grumman Corp., Baltimore, MD
Abstract :
Many space systems require the multiplexing of high voltage analog signals around the spacecraft to drive actuators and motors for telemetry control. While considerable resources have supported the radiation hardening of digital electronics, very little has been focused on this critical high voltage analog requirement. To address this issue, Northrop Grumman has developed a radiation hardened high voltage (+/-15 V) 16:1 analog multiplexer for space applications which is described. This device has completed qualification testing with initial production deliveries beginning in January, 2008. Using a combination of process (CMOS/ SOI) and design techniques, this device features latch-up immune operation and 300 krad(Si) total dose hardness. Life testing has been successfully completed (1000 hours at +150 C). The NGCP3580 has been designed to operate with analog inputs as high as 10 V outside of the +/-15 V supply voltage range. A low voltage (+/-5 V) version of this device (NGCL3571) has been in production since 2001.
Keywords :
CMOS analogue integrated circuits; integrated circuit testing; life testing; multiplexing equipment; radiation hardening (electronics); silicon-on-insulator; space vehicle electronics; - high voltage analog signals; CMOS process; NGCP3580; Northrop Grumman; SOI process; analog multiplexer; latch-up immune operation; life testing; qualification testing; radiation hardening; space applications; temperature 150 C; time 1000 hour; Actuators; Aerospace electronics; Control systems; Multiplexing; Production; Qualifications; Radiation hardening; Space vehicles; Telemetry; Voltage control;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.21
