Title :
Single Event Transient Event Frequency Prediction Model for a Next Generation PLL
Author :
Hafer, C. ; Pfeil, J. ; Bass, D. ; Jordan, A. ; Farris, T.
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO
Abstract :
A predictive SET event frequency model is used to describe the SET performance at any operating condition of a next generation PLL with 189,440 combinations of operating conditions. A DOE approach and 24 cross-section versus LET curves are used to model the large operating space of this PLL.
Keywords :
design of experiments; phase locked loops; radiation hardening (electronics); space vehicle electronics; PLL; SET event frequency prediction model; aerospace applications; design-of-experiment; frequency prediction model; linear energy transfer curve; phase locked loop circuits; single event latchup; single event transient; Clocks; Frequency conversion; Ion beams; Oscillators; Output feedback; Phase locked loops; Predictive models; Single event upset; Testing; US Department of Energy;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.22
