Title :
Remote SEE Testing Capabilities with Heavy Ions and Laser Beams at CYCLONE-HIF and ATLAS Facilities
Author :
Peronnard, P. ; Velazco, R. ; Foucard, G. ; Pouget, V. ; Berger, G. ; Charlier, F. ; Boldrin, F.
Author_Institution :
TIMA Lab., Grenoble
Abstract :
A state-of-the-art electronic testbed was successfully used for implementing remote SEE testing capabilities at two European facilities. This new approach proves to be a flexible, cost effective and complete test solution.
Keywords :
integrated circuit testing; ion beam effects; laser beam effects; radiation hardening (electronics); ATLAS laser facility; CYCLONE-HIF heavy ion facility; SEE remote testing capabilities; electronic testbed; heavy ion irradiation; laser testing facility; single-event effects; Circuit testing; Costs; Electronic equipment testing; Hardware design languages; Integrated circuit testing; Ion beams; Laser beams; Logic testing; Performance evaluation; System testing;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.26
