• DocumentCode
    3022151
  • Title

    Remote SEE Testing Capabilities with Heavy Ions and Laser Beams at CYCLONE-HIF and ATLAS Facilities

  • Author

    Peronnard, P. ; Velazco, R. ; Foucard, G. ; Pouget, V. ; Berger, G. ; Charlier, F. ; Boldrin, F.

  • Author_Institution
    TIMA Lab., Grenoble
  • fYear
    2008
  • fDate
    14-18 July 2008
  • Firstpage
    106
  • Lastpage
    109
  • Abstract
    A state-of-the-art electronic testbed was successfully used for implementing remote SEE testing capabilities at two European facilities. This new approach proves to be a flexible, cost effective and complete test solution.
  • Keywords
    integrated circuit testing; ion beam effects; laser beam effects; radiation hardening (electronics); ATLAS laser facility; CYCLONE-HIF heavy ion facility; SEE remote testing capabilities; electronic testbed; heavy ion irradiation; laser testing facility; single-event effects; Circuit testing; Costs; Electronic equipment testing; Hardware design languages; Integrated circuit testing; Ion beams; Laser beams; Logic testing; Performance evaluation; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2008 IEEE
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    978-1-4244-2545-7
  • Type

    conf

  • DOI
    10.1109/REDW.2008.26
  • Filename
    4638624
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3022151