Title :
Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices
Author :
Bogorad, Alexander L. ; Likar, Justin J. ; Moyer, Stephen K. ; Ditzler, Audrey J. ; Doorley, Graham P. ; Herschitz, Roman
Author_Institution :
Lockheed Martin Commercial Space Syst., Newton, PA
Abstract :
Total dose tests of common devices reveal unexpected dose rate sensitivity. Devices from the same vendor procured to SMD versus military specifications exhibit substantially different dose rate effects. Behavior and critical parameters are compared and discussed.
Keywords :
gamma-ray effects; radiation hardening (electronics); space vehicle electronics; candidate spacecraft electronic devices; dose rate sensitivity; gamma ray source; military specifications; total ionizing dose; Aerospace electronics; Operational amplifiers; Pulse amplifiers; Pulse width modulation; Radiation hardening; Semiconductor optical amplifiers; Silicon; Space technology; Space vehicles; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.29
