Title :
Monte Carlo simulation for single electron circuits
Author :
Kirihara, Masaharu ; Taniguchi, Kenji
Author_Institution :
Dept. of Electron. & Inf. Syst., Osaka Univ., Japan
Abstract :
In single electron circuits composed of small tunnel junctions, capacitances, and voltage sources, a tunneling electron can be described as a discrete charge due to the stochastic nature of a tunneling event. We developed a Monte Carlo simulator for the numerical study of single electron circuits because no conventional simulation methods based on Kirchhoff´s laws can be applicable. The calculated dynamic operation of a quasi-CMOS inverter reveals that ultra small load capacitors give rise to large output voltage fluctuation during the logic operation. Future SET circuits should be designed with several electron logic circuits rather than ultimate single electronic logic circuits in which a bit is represented with an electronic charge
Keywords :
CMOS logic circuits; MOSFET circuits; Monte Carlo methods; circuit analysis computing; digital simulation; electric potential; logic CAD; logic gates; numerical analysis; MOSFET; Monte Carlo simulation; SET circuits; capacitances; discrete charge; electronic charge; load capacitors; numerical study; output voltage fluctuation; quasiCMOS inverter; single electron circuits; small tunnel junctions; stochastic nature; tunneling electron; voltage sources; Capacitance; Circuit simulation; Electrons; Inverters; Logic circuits; Monte Carlo methods; Numerical simulation; Stochastic processes; Tunneling; Voltage;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the ASP-DAC '97 Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
0-7803-3662-3
DOI :
10.1109/ASPDAC.1997.600174