• DocumentCode
    3023350
  • Title

    Addressable current reference array with 170dB dynamic range

  • Author

    Yang, Minhao ; Liu, Shih-Chii ; Li, Chenghan ; Delbruck, Tobi

  • Author_Institution
    Inst. of Neuroinf., Univ. of Zurich, Zurich, Switzerland
  • fYear
    2012
  • fDate
    20-23 May 2012
  • Firstpage
    3110
  • Lastpage
    3113
  • Abstract
    Configurable high-performance bias current reference circuits are useful in complex mixed-signal chips. This paper presents the design of a configurable current reference array with ultra wide dynamic range (DR). A coarse-fine architecture using octal coarse current spacing and 8 bits of fine resolution increases the overall current DR with less area compared with the prior work. Compact current multipliers and dividers also save chip areas. Shifted-source current mirrors and an off-current suppression technique improve the accuracy of generated low currents. A buffer with dual-threshold source followers is used to generate the output biasing voltage with a wide DR input current. Biases are individually addressable and configurable. Measurement results of this design in UMC 0.18μm 1P6M CMOS process suggest that over 170dB DR is achieved at room temperature. Each additional bias occupies an incremental area of 360×22μm2, which is smaller by a factor of 4 compared to the previous design.
  • Keywords
    CMOS integrated circuits; current mirrors; dividing circuits; mixed analogue-digital integrated circuits; multiplying circuits; reference circuits; DR input current; UMC 1P6M CMOS process; addressable current reference array; buffer; chip area; coarse-fine architecture; compact current multiplier; complex mixed-signal chips; configurable current reference array; configurable high-performance bias current reference circuit; divider; dual-threshold source follower; octal coarse current spacing; off-current suppression; output biasing voltage; shifted-source current mirror; size 0.18 mum; temperature 293 K to 298 K; ultra wide dynamic range; word length 8 bit; Arrays; Current measurement; Dynamic range; Leakage current; Logic gates; Mirrors; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
  • Conference_Location
    Seoul
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-0218-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2012.6271979
  • Filename
    6271979