Title : 
97% Top hat efficiency, 4 J/cm2 damage threshold compression gratings
         
        
            Author : 
Canova, F. ; Chambaret, J.P. ; Uteza, O. ; Delaporte, P. ; Tondusson, M. ; Freysz, E. ; Parriaux, O. ; Flury, M. ; Tonchev, S. ; Lyndin, N.
         
        
            Author_Institution : 
ENSTA- Ecole Polytech., Palaiseau
         
        
        
        
        
        
            Abstract : 
High diffraction efficiency all-dielectric pulse compression grating is reported with a close to 100 % flat top over more than 20 nm spectral width around 800 nm wavelength and more than 4 J/cm2 damage threshold.
         
        
            Keywords : 
diffraction gratings; optical pulse compression; all-dielectric pulse compression grating; damage threshold compression gratings; optical pulse compression; top hat efficiency; Diffraction gratings; Hafnium oxide; Mirrors; Nonhomogeneous media; Optical diffraction; Optical films; Optical pulse compression; Optical refraction; Silicon compounds; Testing;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
         
        
            Conference_Location : 
Baltimore, MD
         
        
            Print_ISBN : 
978-1-55752-834-6
         
        
        
            DOI : 
10.1109/CLEO.2007.4453572