Title :
A 22-bit 110ps time-interpolated Time-to-Digital Converter
Author :
Guo, Jian ; Sonkusale, Sameer
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
Abstract :
This paper presents a 22-bit time-interpolated Time-to-Digital Converter (TDC) with 110ps temporal resolution for biochemical sensing applications, which utilize time-resolve luminescence imaging technique. The TDC achieves wide dynamic range operation by incorporating a hybrid architecture that combines a 14-bit digital counter based coarse TDC and an 8-bit Voltage-Controlled Delay Line (VCDL) based fine TDC. We have proposed and implemented a novel readout algorithm for VCDL operation that achieves high throughput temporal measurement. A prototype chip has been fabricated in a 65nm standard CMOS process and it consumes 2.4mA power from a 1.2V supply. The measurement results on the fabricated TDC demonstrates a Differential Nonlinearity (DNL) of 0.49LSB and an Integral Nonlinearity (INL) or 1.67LSB (1LSB=110ps). The implemented TDC architecture and its fast readout circuit can be readily used in a variety of time-resolved biomedical sensing or high-speed imaging applications that require both wide dynamic range performance and high frame rate implementations.
Keywords :
CMOS image sensors; CMOS logic circuits; analogue-digital conversion; biosensors; chemical sensors; interpolation; readout electronics; CMOS process; DNL; INL; VCDL; biochemical sensing applications; current 2.4 mA; differential nonlinearity; digital counter based coarse TDC; high throughput temporal measurement; high-speed imaging applications; integral nonlinearity; off-chip FPGA; readout circuit; size 65 nm; temporal resolution; time 110 ps; time-interpolated TDC architecture; time-interpolated time-to-digital converter; time-resolve luminescence imaging technique; time-resolved biomedical sensing; voltage 1.2 V; voltage-controlled delay line; word length 14 bit; word length 22 bit; word length 8 bit; Clocks; Computer architecture; Delay; Delay lines; Dynamic range; Imaging; Radiation detectors;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6271994