Title :
Estimating dither thresholds from the average of halftone dots
Author_Institution :
Dept. of Electron. Eng., Nat. United Univ., Miaoli, Taiwan
Abstract :
Conventional approach to dither threshold estimation is based on the full dot patterns (FDP´s), which are selected from the given halftone. The main drawback of the approach is some FDP´s may be missing from the halftone. We propose to estimate the threshold from the average of all the halftone dots. Our method can additionally overcome the missing FDP´s arising from the nearly-constant gray values present in the image but not gathered enough to cover a “full dot”. Experimental results show that compared with the FDP-based approach, our method is better and less degraded by the increasing of threshold size.
Keywords :
image colour analysis; image segmentation; dither threshold estimating; dither threshold estimation; full dot pattern; halftone dots; nearly-constant gray value; Airplanes; Educational institutions; Estimation; Histograms; Image reconstruction; Manganese; Signal processing;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6272012