Title :
A test paradigm for analog and mixed-signal circuits and systems
Author :
Wang, Cheng-Ping ; Hatzopoulos, Alkis A. ; Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
This paper presents a built-in self-test (BIST) paradigm for analog/mixed-signal circuits and systems. The BIST structure uses a virtual instrument to generate test inputs, to measure the output responses, and to compare the measured responses with the good ones in digital form. Thus, no real instrument is necessary
Keywords :
analogue integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; analog circuit; built-in self-test; mixed-signal circuit; virtual instrument; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Circuits and systems; Frequency measurement; Instruments; Semiconductor device measurement; System testing;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.541513
