• DocumentCode
    302489
  • Title

    Analysis of Chua´s circuit with transmission line

  • Author

    Kawata, Junji ; Nishio, Yoshifumi ; Ushida, Akio

  • Author_Institution
    Dept. of Mech. & Electron. Eng., Tokushima Bunri Univ., Japan
  • Volume
    3
  • fYear
    1996
  • fDate
    12-15 May 1996
  • Firstpage
    201
  • Abstract
    We have analyzed Chua´s circuit with a transmission line, where the parallel LC resonator in original Chua´s circuit is replaced by a lossless or lossy transmission line. Some papers about Chua´s circuit with lossless transmission line (time-delayed Chua´s circuit) have been reported, but whose analysis is rather simple because the signal on it is not affected an attenuation due to the line loss. On the other hand, the method of characteristics is developed for the simulation of high-speed VLSI circuits containing lossy transmission lines. In this paper, we will apply this method to analyze Chua´s circuit with transmission line. The linear interpolation and the variable stepsize integration techniques are introduced to get the accurate solution around the breakpoint of piecewise linear function. Consequently we found from the numerical experiments that Chua´s circuit with lossy transmission line has the complicate and interesting chaotic attractors compared to Chua´s circuit with lossless line
  • Keywords
    Chua´s circuit; chaos; circuit analysis computing; nonlinear network analysis; piecewise-linear techniques; transmission line theory; Chua´s circuit; chaotic attractor; high-speed VLSI circuit; integration; linear interpolation; lossless line; lossy line; piecewise linear function; simulation; time delay; transmission line; Attenuation; Chaos; Circuit analysis; Circuit simulation; Distributed parameter circuits; Interpolation; Piecewise linear techniques; Propagation losses; Signal analysis; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3073-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1996.541515
  • Filename
    541515