DocumentCode
3025511
Title
An AC-SA based Test Set Optimization method
Author
Fu Xin ; Fu Shuai
Author_Institution
Inf. Eng. Sch., Jinlin Bus. & Technol. Coll., Changchun, China
fYear
2013
fDate
20-22 Dec. 2013
Firstpage
1736
Lastpage
1739
Abstract
Nowadays fault diagnosis of circuits has been more and more difficult because of digital circuit integrity, and this paper present an optimization method based on ant colony algorithm and simulated annealing algorithm to deal with the problem of Test Set Optimization. Experiment results show that this method made a great effectively in achieving global optimal solution of test optimization selection problem.
Keywords
ant colony optimisation; fault diagnosis; integrated circuit testing; logic testing; simulated annealing; AC-SA based test set optimization method; ant colony algorithm; digital circuit integrity; fault diagnosis; simulated annealing algorithm; test optimization selection problem; Annealing; Educational institutions; Fault detection; Genetics; Integrated circuits; Simulated annealing; ant colony algorithm; fault diagnosis; simulated annealing algorithm; test set optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
Conference_Location
Shengyang
Print_ISBN
978-1-4799-2564-3
Type
conf
DOI
10.1109/MEC.2013.6885335
Filename
6885335
Link To Document