• DocumentCode
    3025679
  • Title

    Thermal and optical analysis of four-chip HPLED package with different thermal interface material

  • Author

    Lee, S.Y. ; Devarajan, Mutharasu

  • Author_Institution
    Sch. of Phys., Univ. Sains Malaysia (USM), Minden, Malaysia
  • fYear
    2012
  • fDate
    19-21 Sept. 2012
  • Firstpage
    499
  • Lastpage
    502
  • Abstract
    This paper is focused on thermal and optical properties of four-chip HPLED package with different thermal interface materials. The package is attached to MCPCB via solder paste and thermal compound. Through cumulative structure function, solder point of HPLED package is determined as 2.955K/W. The photometric properties of these two HBLED packages are evaluated by using TERALED. The total thermal resistance of the HPLED-S and HPLED-C is 10.68K/W and 13.00K/W respectively. Results show that the junction temperatures of HPLED with solder paste is lower than HPLED with thermal compound. Optical power, wall plug efficiency and luminous flux of both packages under various ambient temperature and forward current are discussed in this study. The HPLED-C produces more luminance than HPLED-S, but high thermal resistance of the HPLED-C induces the rise in junction temperature therefore increases the degradation rate of wall plug efficiency of the package.
  • Keywords
    electronics packaging; light emitting diodes; printed circuits; solders; thermal analysis; thermal resistance; HPLED-C; HPLED-S; MCPCB; TERALED; ambient temperature; cumulative structure function; forward current; four-chip HPLED package; junction temperatures; luminous flux; multichip LED; optical analysis; optical power; optical property; photometric property; solder paste; solder point; thermal analysis; thermal compound; thermal interface material; thermal property; thermal resistance; wall plug efficiency; Electronic packaging thermal management; Junctions; Light emitting diodes; Materials; Temperature measurement; Thermal resistance; HPLED; junction temperature; thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2012 10th IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4673-2395-6
  • Electronic_ISBN
    978-1-4673-2394-9
  • Type

    conf

  • DOI
    10.1109/SMElec.2012.6417195
  • Filename
    6417195