• DocumentCode
    3025723
  • Title

    New low power delay element in self resetting logic with modified Gated Diffusion Input technique

  • Author

    Ramadass, U. ; Dhavachelvan, P.

  • Author_Institution
    Dept. of Comput. Sci., Pondicherry Univ., Pondicherry, India
  • fYear
    2012
  • fDate
    19-21 Sept. 2012
  • Firstpage
    507
  • Lastpage
    511
  • Abstract
    Low power design has become one of the primary focuses in digital VLSI circuits, especially in clocked devices like microprocessor and portable devices. Optimization of several devices for speed and power is a significant issue in low-voltage and low-power applications. These issues can be overcome by incorporating Gated Diffusion Input (GDI) technique. Now-a-days dynamic circuits are becoming increasingly popular because of the speed advantage over static CMOS logic circuits. A fundamental difficulty with dynamic circuits is the monotonicity requirement and difficulties like charge sharing feed through, charge leakage, single-event upsets, etc. These issues can be eliminated using Self-reset logic (SRL). This logic provides a design solution where the clocking overhead is minimized. So the tradeoff between speed and power can be achieved through SRL and GDI technique. A new family of Modified self-reset logic (SRL) cells implemented with modified GDI technique is presented in this paper. The implementations proposed in this work are clocked storage element like D-FF in SRL with Modified Gate Diffusion Input Technique. This technique allows reducing power consumption and delay of digital circuits, while maintaining low complexity of logic design. Delay and power has been evaluated by Tanner simulator using TSMC 0.250μm technology. The simulation results reveal better delay and power performance of proposed delay elements as compared to existing dynamic, GDI cell and CMOS at 0.250μm technology.
  • Keywords
    CMOS logic circuits; VLSI; delays; logic design; low-power electronics; D-FF clocked storage element; GDI cell; SRL cells; TSMC CMOS technology; Tanner simulator; charge leakage; charge sharing feed through; clocking overhead; digital VLSI circuits; digital circuit delay; dynamic circuits; logic design low complexity; low power delay element; low power design; microprocessor; modified GDI technique; modified gated diffusion input technique; modified self-reset logic cells; portable devices; power consumption; single-event upsets; size 0.250 mum; static CMOS logic circuits; CMOS integrated circuits; Delay; Latches; Logic gates; MOS devices; Power dissipation; Transistors; ASIC; GDI cells; Modified Gate Diffusion Input technique; Self-resetting Logic; charge leakage; single-event upsets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2012 10th IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4673-2395-6
  • Electronic_ISBN
    978-1-4673-2394-9
  • Type

    conf

  • DOI
    10.1109/SMElec.2012.6417197
  • Filename
    6417197