Title :
Design, Fabrication, And Automated Testing Of 32 Channel Integrated MMS/MESFET OEIC Receiver Arrays
Author :
Rogers, D.L. ; Walker, S. ; Gowda, S. ; Ainspan, H.
Author_Institution :
IBM T.J. Watson Research Center
Keywords :
Automatic testing; Circuit testing; Clocks; Detectors; Fabrication; High speed optical techniques; Optical receivers; Optical sensors; Optoelectronic devices; Probes;
Conference_Titel :
Integrated Optoelectronics, 1994., Proceedings of IEE/LEOS Summer Topical Meetings:
Print_ISBN :
0-7803-1752-1
DOI :
10.1109/LEOSST.1994.700410
