Title :
Statistical Analyses of
and
Recorded at Electric A
Author :
Yu-Jen Hsu ; Chan-Nan Lu
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
Abstract :
Adoption of the IEC flicker standard by IEEE would encourage countries currently using ΔV10 flicker standard to consider either updating the ΔV10 calculation to make it more suitable for modern day applications, or switching to the IEC standard. In the process of revising the flicker standard, the design of flicker planning level is important. For this purpose, this letter presents comparative statistical analyses of flicker measurements based on present Pst and ΔV10 standards. Besides the comparison of synchronous flicker severity indices in 10-min intervals, analyses are also conducted using daily flicker statistical reference values measured at the point of common coupling (PCC) of ac and dc electric arc furnace facilities.
Keywords :
IEC standards; IEEE standards; arc furnaces; power supply quality; power system measurement; statistical analysis; voltage measurement; IEC flicker standard; IEEE standards; PCC; daily flicker statistical reference values; dc electric arc furnace facilities; electric arc furnaces; flicker measurements; flicker planning level; point-of-common coupling; statistical analyses; synchronous flicker severity indices; Furnaces; IEC standards; Indexes; Planning; Power quality; Voltage measurement; Electric arc furnace; flickers; power quality (PQ);
Journal_Title :
Power Delivery, IEEE Transactions on
DOI :
10.1109/TPWRD.2013.2280931