DocumentCode :
3026396
Title :
Simultaneous bulk hydrogen passivation and selective emitter formation assisted by ECR-plasma applied to industrial mc-Si solar cells
Author :
Debarge, L. ; Roesch, G. ; Boudaden, J. ; Muller, J.C. ; Monna, R. ; Sarti, D. ; Ballutaud, D.
Author_Institution :
Lab. PHASE, CNRS, Strasbourg, France
fYear :
2000
fDate :
2000
Firstpage :
87
Lastpage :
90
Abstract :
The authors present a new way of realising a selective emitter, using the simultaneous etching and hydrogenation properties of the ECR-H 2 plasma (electron cyclotron resonance hydrogen plasma). The impact of the H2-plasma on multicrystalline silicon (POLIX TM) is studied in terms of bulk lifetime. It is shown that during the hydrogenation step, the ECR-plasma etches back the emitter surface at a rate of about 100 nm/hour. Besides, on sheet resistance mappings, they have observed that the etch rate depends on grain orientation. The etch-back is used to form the selective emitter during the hydrogenation process. Solar cells were realised using the screen-printed contacts as a mask against the plasma effect. The short circuit current can gain more than 1 mA/cm2, the gain coming from the whole spectral range, this due to the less recombinating surface and the hydrogenated bulk material
Keywords :
carrier lifetime; elemental semiconductors; etching; hydrogenation; passivation; plasma materials processing; plasma radiofrequency heating; silicon; solar cells; Si; bulk hydrogen passivation; bulk lifetime; electron cyclotron resonance hydrogen plasma; emitter back surface etching; etch rate; grain orientation; hydrogenated bulk material; hydrogenation step; multicrystalline Si solar cells; plasma effect mask; recombinating surface; screen-printed contacts; selective emitter formation; sheet resistance mappings; short circuit current; Cyclotrons; Electron emission; Etching; Hydrogen; Passivation; Plasma applications; Plasma properties; Resonance; Silicon; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.915759
Filename :
915759
Link To Document :
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