Structural, morphological and photoluminescence studies of SnO2 microparticles

Author

Karkeng Lim ; Hamid, Muhammad Azmi Abd ; Shamsudin, R. ; Jalar, A. ; Al-Hardan, N.H.

Author_Institution

Sch. of Appl. Phys., Univ. Kebangsaan Malaysia, Bangi, Malaysia

fYear

2012

fDate

19-21 Sept. 2012

Firstpage

733

Lastpage

735

Abstract

Tin dioxide (SnO₂) microparticles have been grown on p-type Si (100) substrate by thermal evaporation method. The experiment was conducted at 1080^oC, under 1.6% oxygen (O₂) gas in atmospheric ambient. The prepared film were characterized using X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM) equipped with energy dispersive X-ray spectroscopy (EDX) and photoluminescence (PL) measurement. The growth particles were crystalline with size ranging from 100 nm to 500 nm. The PL spectrum of the SnO₂ microparticles exhibits a broad visible light emission with a peak centered at around 611 nm.

Keywords

X-ray chemical analysis; X-ray diffraction; X-ray spectroscopy; nanoparticles; photoluminescence; scanning electron microscopy; semiconductor thin films; tin compounds; visible spectra; EDX; FESEM; PL measurement; PL spectrum; Si; SnO₂; X-ray diffraction; XRD; atmospheric ambient; broad visible light emission; energy dispersive X-ray spectroscopy; field emission scanning electron microscopy; growth particles; microparticles morphological study; microparticles photoluminescence study; microparticles structural study; p-type substrate; photoluminescence measurement; size 611 nm; thermal evaporation method; Photoluminescence; Substrates; Tin; X-ray scattering; Zinc oxide;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Electronics (ICSE), 2012 10th IEEE International Conference on

Conference_Location

Kuala Lumpur

Print_ISBN

978-1-4673-2395-6

Electronic_ISBN

978-1-4673-2394-9

Type

conf

DOI

10.1109/SMElec.2012.6417247

Filename

6417247