Title :
Errors of phase and group delays in SAW RFID with phase modulation
Author :
Han, Tao ; Wei, Lin ; Lin, Jiming ; Wang, Weibiao ; Wu, Haodong ; Shui, Yongan ; Du, Xuesong ; Ding, Yi ; Cao, Liang ; Qin, Tinghui
Author_Institution :
Dept. of Instrum. Eng., Shanghai Jiaotong Univ., Shanghai
Abstract :
In order to obtain the exact time delay of pulses in the surface acoustic wave (SAW) based radio frequency identification (RFID) at unknown temperature, we propose a method for obtaining a high phase ambiguity resolution by measuring group delays and constructing some restriction on the exact positions of reflectors. To define the restriction parameters for a SAW RFID system with large code capacity and reliable identification, it is imperative to have a priori knowledge on the errors of group delay and phase. In this paper, we present the experimental and simulation errors for both phases and group delay, originated from the design procedure, the temperature effect, the fabrication process and the measurement. The temperature range in our investigation is -5deg -45degC. The average error of phase delay is about 4deg; the maximum error of phase delay is about 16deg. The maximum error of group delay is about 10 periods.
Keywords :
delays; phase modulation; radiofrequency identification; surface acoustic wave devices; SAW RFID; group delay; high phase ambiguity resolution; phase delay; phase error; phase modulation; reflector position; surface acoustic wave based radio frequency identification; temperature -5 C to 45 C; Acoustic measurements; Acoustic pulses; Acoustic waves; Delay effects; Phase measurement; Phase modulation; Pulse measurements; Radiofrequency identification; Surface acoustic waves; Temperature; group delay error; phase error; radio frequency identification; surface acoustic wave;
Conference_Titel :
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2428-3
Electronic_ISBN :
978-1-4244-2480-1
DOI :
10.1109/ULTSYM.2008.0482