• DocumentCode
    3026933
  • Title

    Errors of phase and group delays in SAW RFID with phase modulation

  • Author

    Han, Tao ; Wei, Lin ; Lin, Jiming ; Wang, Weibiao ; Wu, Haodong ; Shui, Yongan ; Du, Xuesong ; Ding, Yi ; Cao, Liang ; Qin, Tinghui

  • Author_Institution
    Dept. of Instrum. Eng., Shanghai Jiaotong Univ., Shanghai
  • fYear
    2008
  • fDate
    2-5 Nov. 2008
  • Firstpage
    1955
  • Lastpage
    1958
  • Abstract
    In order to obtain the exact time delay of pulses in the surface acoustic wave (SAW) based radio frequency identification (RFID) at unknown temperature, we propose a method for obtaining a high phase ambiguity resolution by measuring group delays and constructing some restriction on the exact positions of reflectors. To define the restriction parameters for a SAW RFID system with large code capacity and reliable identification, it is imperative to have a priori knowledge on the errors of group delay and phase. In this paper, we present the experimental and simulation errors for both phases and group delay, originated from the design procedure, the temperature effect, the fabrication process and the measurement. The temperature range in our investigation is -5deg -45degC. The average error of phase delay is about 4deg; the maximum error of phase delay is about 16deg. The maximum error of group delay is about 10 periods.
  • Keywords
    delays; phase modulation; radiofrequency identification; surface acoustic wave devices; SAW RFID; group delay; high phase ambiguity resolution; phase delay; phase error; phase modulation; reflector position; surface acoustic wave based radio frequency identification; temperature -5 C to 45 C; Acoustic measurements; Acoustic pulses; Acoustic waves; Delay effects; Phase measurement; Phase modulation; Pulse measurements; Radiofrequency identification; Surface acoustic waves; Temperature; group delay error; phase error; radio frequency identification; surface acoustic wave;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2008. IUS 2008. IEEE
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2428-3
  • Electronic_ISBN
    978-1-4244-2480-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2008.0482
  • Filename
    4803628