DocumentCode :
3026978
Title :
ADC performance limitations due to quantizer non-idealities
Author :
Kothapalli, Ganesh
Author_Institution :
Edith Cowan Univ., Perth, WA, Australia
Volume :
3
fYear :
2003
fDate :
14-17 Dec. 2003
Firstpage :
1240
Abstract :
A low-voltage low-power CMOS Sigma-Delta Modulator (SDM) is presented. The influence of a dynamic latched comparator on the performance of the SDM are studied with the help of SPICE simulations. SPICE BSIM4 models are used to study the transient behaviour of the overall circuit. The latched comparator is devised to be used to detect very small differential signals in the presence of large common-mode signals. An 8-bit second-order Sigma-Delta Modulator is used to demonstrate the limitations and potential, solutions associated with the use of the latched comparator. The aim of this study is to use such an ADC in the CMOS imagers to be realized in a low-cost standard digital process technology. Another aim of this study is to utilize an identical design layout of the latched comparator to quantize the full-scale range of signals (LSB to MSB).
Keywords :
CMOS integrated circuits; SPICE; comparators (circuits); error compensation; low-power electronics; quantisation (signal); sigma-delta modulation; ADC performance limitations; CMOS imagers; CMOS sigma-delta modulator; SPICE simulations; dynamic latched comparator; error compensation; large common-mode signals; low-voltage low-power modulator; quantizer nonidealities; second-order modulator; small differential signals; transient behaviour; CMOS process; Circuit simulation; Delta-sigma modulation; Feedback; Latches; MOSFETs; Parasitic capacitance; SPICE; Semiconductor device modeling; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International Conference on
Print_ISBN :
0-7803-8163-7
Type :
conf
DOI :
10.1109/ICECS.2003.1301738
Filename :
1301738
Link To Document :
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