Title :
Discrete MRF model parameters as features for texture classification
Author :
Chen, Chaur-Chin ; Dubes, Richard C.
Author_Institution :
Inst. of Comput. Sci., Nat. Tsing Hua Univ., Hsin Chu, Taiwan
Abstract :
Texture classification systems are characterized, existing techniques for texture classification are reviewed, and a method for extracting textural features for classification is proposed. A second-order, four-color, auto-binomial Markov random field (MRF) with four parameters is fitted to given textured images, and the estimated parameters are used as features for classification. The MRF-based features are compared experimentally to the features derived from spatial gray-level dependence matrices (SGLDM) for synthetic and natural textures. The MRF-based features are generative, but the SGLDM features are only descriptive. MRF-based features can be extracted in one step, which means that the four features can be extracted by simply fitting the model to a texture pattern. Experiments show that the MRF-based features outperform the SGLDM-based features
Keywords :
Markov processes; parameter estimation; pattern recognition; Markov random field; discrete MRF model; feature extraction; parameter estimation; pattern recognition; spatial gray-level dependence matrices; texture classification; Computer science; Error analysis; Feature extraction; Gray-scale; Markov random fields; Parameter estimation; Remote sensing; Size measurement; Stochastic processes; Visual perception;
Conference_Titel :
Systems, Man and Cybernetics, 1990. Conference Proceedings., IEEE International Conference on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-597-0
DOI :
10.1109/ICSMC.1990.142047