Title :
A static test compaction technique for combinational circuits based on independent fault clustering
Author :
Osais, Yuhyu E. ; El-Maleh, Aiman H.
Author_Institution :
Dept. of Comput. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Abstract :
Testing system-on-chip involves applying huge amounts of test data, which is stored in the tester memory and then transferred to the circuit under test during test application. Therefore, practical techniques, such as test compression and compaction, are required to reduce the amount of test data in order to reduce both the total testing time and the memory requirements for the tester. In this paper, a new static compaction algorithm for combinational circuits is presented. The algorithm is referred to as independent fault clustering. It is based on a new concept called test vector decomposition. Experimental results for benchmark circuits demonstrate the effectiveness of the new static compaction algorithm.
Keywords :
automatic test pattern generation; combinational circuits; fault simulation; graph colouring; independent component analysis; integrated circuit testing; logic testing; system-on-chip; benchmark circuits; combinational circuits; fault coverage; fault matching; graph coloring; independent fault clustering; random merging; reverse-order fault simulation; static test compaction technique; system-on-chip; test vector decomposition; Automatic test pattern generation; Circuit faults; Circuit testing; Clustering algorithms; Combinational circuits; Compaction; Design methodology; Fault detection; System testing; System-on-a-chip;
Conference_Titel :
Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International Conference on
Print_ISBN :
0-7803-8163-7
DOI :
10.1109/ICECS.2003.1301757
