DocumentCode
3027417
Title
Aspects of diagnostic rules for manufacturing systems: generation, generalization and reduction
Author
Chang, Shaw Jen ; Goldbogen, Geoffrey ; DiCesare, Frank
Author_Institution
Rensselaer Polytech. Inst., Troy, NY, USA
fYear
1990
fDate
4-7 Nov 1990
Firstpage
78
Lastpage
83
Abstract
The diagnostic step of the error recovery process in manufacturing systems is considered, and theories for evaluating the redundancy of failure knowledge in such systems are developed. The work is based on a diagnostic knowledge structure called the action-error-feature data set. Previously derived theories and a simple computational operation, called the covering analysis, for determining and testing N -multiple-error diagnosability of the data set are further developed to improve the efficiency of the diagnostic steps. Methods for evaluating and deleting redundant features in the data set are obtained, resulting in a qualitative measure for the embedded diagnostic knowledge in terms of the ability to diagnose the number of multiple simultaneous errors and a quantitative measure in terms of the redundant features in the system. Diagnostic rules for a specific error are generated, generalized, and encoded soon after the error is diagnosed at the first occurrence. The generalized rules can be applied in similar cases for a specific error and improve efficiency
Keywords
fault location; knowledge based systems; knowledge representation; manufacturing data processing; production control; redundancy; action-error-feature data set; covering analysis; diagnostic knowledge structure; error recovery process; fault diagnosis; knowledge based systems; manufacturing systems; redundancy; Buildings; Computer aided manufacturing; Diagnostic expert systems; Expert systems; Knowledge acquisition; Knowledge engineering; Manufacturing processes; Manufacturing systems; Pulp manufacturing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man and Cybernetics, 1990. Conference Proceedings., IEEE International Conference on
Conference_Location
Los Angeles, CA
Print_ISBN
0-87942-597-0
Type
conf
DOI
10.1109/ICSMC.1990.142064
Filename
142064
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