Title :
Special probe waveforms for flaw detection at “hot spots”
Author :
Greve, D.W. ; Oppenheim, I.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
Abstract :
In this paper we examine the creation of a special probe waveform that, when applied to an emitting transducer at location A, results in a strong received signal at that transducer at a particular later time only when a scattering center is present at location B. The probing waveform can be calculated directly from the Green´s function for propagation from A to B. Such a probe waveform can be used to detect scattering centers at the ldquohot spotrdquo location B.
Keywords :
flaw detection; ultrasonic materials testing; Green´s function; emitting transducer; flaw detection; hot spots; scattering center; special probe waveforms; Acoustic emission; Acoustic pulses; Acoustic scattering; Frequency; Green´s function methods; Inspection; Object detection; Probes; Reflection; Transducers; inspection; probe waveform; time reversal;
Conference_Titel :
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2428-3
Electronic_ISBN :
978-1-4244-2480-1
DOI :
10.1109/ULTSYM.2008.0044
