Title :
Exact risk analysis of wavelet spectrum thresholding rules
Author_Institution :
Fac. of Electr. Eng. & Commun. Technol., Brno Univ. of Technol., Czech Republic
Abstract :
The signal analysis and processing based on wavelets has recently been a much used discipline, whose range of applications spreads steadily. One of its most important applications is signal denoising. In this area, the so-called thresholding is an important technique of signal processing. Besides common thresholding rules, several others has been developed. Their statistical properties obtained via so-called exact risk analysis are described in this paper.
Keywords :
normal distribution; risk analysis; signal denoising; wavelet transforms; complex conjugate; exact risk analysis; multivariate normal distribution; optimal threshold value; signal denoising; statistical properties; thresholding rules; wavelet spectrum; Additive noise; Communications technology; Discrete wavelet transforms; Noise reduction; Risk analysis; Signal analysis; Signal denoising; Wavelet analysis; Wavelet coefficients; Wavelet transforms;
Conference_Titel :
Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International Conference on
Print_ISBN :
0-7803-8163-7
DOI :
10.1109/ICECS.2003.1301820
