• DocumentCode
    3027951
  • Title

    Novel uses of TiO2 in crystalline silicon solar cells

  • Author

    Richards, Bryce S. ; Cotter, Jeffrey E. ; Honsberg, Christiana B. ; Wenham, AndStuart R.

  • Author_Institution
    Centre for Photovoltaic Eng., New South Wales Univ., Sydney, NSW, Australia
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    Novel applications for titanium dioxide (TiO2) thin films have the potential to reduce production costs of silicon (Si) solar cells, especially for structures like the buried-contact solar cell. This paper demonstrates several new uses for TiO2 films. Firstly, it is demonstrated that the TiO2 film does not contaminate the silicon wafer or furnace after lengthy high-temperature processing. Secondly, a thin silicon dioxide passivation layer can be grown at the TiO2/Si interface by performing a brief oxidation after the deposition of the TiO2. With this method, very low emitter dark saturation currents have been achieved on lightly-diffused high-resistivity float zone wafers. Thirdly, TiO2 films doped with 1% phosphorus were investigated as an emitter dopant source. Initial results have shown that light diffusions are possible. Finally, the applicability of TiO2 as a phosphorus diffusion barrier was investigated
  • Keywords
    elemental semiconductors; oxidation; passivation; semiconductor device manufacture; semiconductor thin films; silicon; solar cells; spray coating techniques; spray coatings; titanium compounds; Si; Si solar cells; TiO2; TiO2 thin films; buried-contact solar cell; emitter dark saturation currents; emitter dopant source; float zone wafers; high-temperature processing; oxidation; passivation layer; phosphorus diffusion barrier; production costs reduction; Costs; Furnaces; Oxidation; Passivation; Photovoltaic cells; Production; Semiconductor films; Semiconductor thin films; Silicon compounds; Titanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.915844
  • Filename
    915844