DocumentCode
3027951
Title
Novel uses of TiO2 in crystalline silicon solar cells
Author
Richards, Bryce S. ; Cotter, Jeffrey E. ; Honsberg, Christiana B. ; Wenham, AndStuart R.
Author_Institution
Centre for Photovoltaic Eng., New South Wales Univ., Sydney, NSW, Australia
fYear
2000
fDate
2000
Firstpage
375
Lastpage
378
Abstract
Novel applications for titanium dioxide (TiO2) thin films have the potential to reduce production costs of silicon (Si) solar cells, especially for structures like the buried-contact solar cell. This paper demonstrates several new uses for TiO2 films. Firstly, it is demonstrated that the TiO2 film does not contaminate the silicon wafer or furnace after lengthy high-temperature processing. Secondly, a thin silicon dioxide passivation layer can be grown at the TiO2/Si interface by performing a brief oxidation after the deposition of the TiO2. With this method, very low emitter dark saturation currents have been achieved on lightly-diffused high-resistivity float zone wafers. Thirdly, TiO2 films doped with 1% phosphorus were investigated as an emitter dopant source. Initial results have shown that light diffusions are possible. Finally, the applicability of TiO2 as a phosphorus diffusion barrier was investigated
Keywords
elemental semiconductors; oxidation; passivation; semiconductor device manufacture; semiconductor thin films; silicon; solar cells; spray coating techniques; spray coatings; titanium compounds; Si; Si solar cells; TiO2; TiO2 thin films; buried-contact solar cell; emitter dark saturation currents; emitter dopant source; float zone wafers; high-temperature processing; oxidation; passivation layer; phosphorus diffusion barrier; production costs reduction; Costs; Furnaces; Oxidation; Passivation; Photovoltaic cells; Production; Semiconductor films; Semiconductor thin films; Silicon compounds; Titanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.915844
Filename
915844
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