DocumentCode
3028226
Title
After 60 years: A new formula for computing quality factor is warranted
Author
Feld, David A. ; Parker, Reed ; Ruby, Richard ; Bradley, Paul ; Dong, Shim
Author_Institution
AVAGO Technol., San Jose, CA
fYear
2008
fDate
2-5 Nov. 2008
Firstpage
431
Lastpage
436
Abstract
A new formulation for computing the unloaded quality factor (Q) of a resonator or of any terminated electromagnetic or piezoelectric cavity from its measured S parameters is proposed. This formulation, based on the work of Dicke, and Bode, computes Q at a continuum of frequencies from below the resonant frequency (fs) to above the anti-resonant frequency (fp). Sixty years ago Dicke and Beringer derived a pair of formulations for Q in terms of the measured impedance (Z) and admittance (Y). The new formulation has two important advantages over Dicke´s formulations: (1) Even for resonators that are free of spurious resonances - whose S-parameters are near ideal -- Dicke´s Z and Y based formulations yield erroneous Q values over a range of frequencies (called ldquodead zonesrdquo) in the vicinity of the frequencies at which the functions Z and Y are singular (at fp and fs respectively). Since the S parameters of such an ideal resonator do not have any singularities, the new Q formulation provides reliable Q values over the full range of frequencies. (2) For non-ideal resonators exhibiting spurious lateral-mode resonances in certain frequency ranges, both the new and Dicke formulations report Q values that are clearly erroneous since they oscillate from positive to negative. Dicke does not explain why his formulation breaks down in such regions nor have we found such an explanation in the literature. In contrast to this, this work explains why the S parameter based Q formula is invalidated over regions of frequency space in which ln(mag(S)) fluctuates wildly. We show that in such regions that pre-conditioning of the S-parameter data with a Gaussian window average is useful in yielding a meaningful value for Q. We propose that the S parameter based Q formulation, being devoid of ldquodead zonesrdquo should be used as a standard by which piezoelectric resonators fabricated in different technologies e.g. FBAR, SAW, BAW be compared.
Keywords
Gaussian processes; Q-factor; S-parameters; crystal resonators; surface acoustic wave devices; BAW; FBAR; Gaussian window; S parameter based Q formula; SAW; electromagnetic cavity; nonideal resonators; piezoelectric cavity; piezoelectric resonators; quality factor; Admittance measurement; Electromagnetic measurements; Film bulk acoustic resonators; Impedance measurement; Q factor; Q measurement; Resonance; Resonant frequency; Scattering parameters; Surface acoustic waves; Bode; Dicke; energy storage; group delay; lossless network; low-loss network; power dissipation; unloaded Q;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4244-2428-3
Electronic_ISBN
978-1-4244-2480-1
Type
conf
DOI
10.1109/ULTSYM.2008.0105
Filename
4803696
Link To Document