Title :
Texture modeling using stochastic languages
Author_Institution :
Purdue University, West Lafayette, Indiana
Keywords :
Distortion measurement; Layout; Noise measurement; Stochastic processes; Tellurium;
Conference_Titel :
Decision and Control including the Symposium on Adaptive Processes, 1979 18th IEEE Conference on
Conference_Location :
Fort Lauderdale, FL, USA
DOI :
10.1109/CDC.1979.270138
