Title :
Research and design of data acquisition system in TD-LTE Wireless Integrated Testing Platform
Author :
Chen, Fatang ; Ye, Jian ; Sun, Linqi
Author_Institution :
Chongqing Key Lab. of Mobile Commun., Chongqing Univ. of Posts & Telecommun. (CQUPT), Chongqing, China
Abstract :
Based on TD-LTE (TD-SCDMA Long Term Evolution) Integrated Testing Platform, data acquisition need to be completed between DSP and FPGA, a realizing scheme of downlink link processing in system is proposed, with which complete the design and verification of the McBSP (Multichannel Buffered Serial Port) interface in the FPGA chip of series Virtex 5. The scheme has been used in TD-LTE wireless integrated testing instruments to complete large-capacity uplink data acquisition, meet the requirements of TD-LTE test in terms of processing speed and data accuracy.
Keywords :
Long Term Evolution; code division multiple access; data acquisition; digital signal processing chips; field programmable gate arrays; radio links; time division multiple access; DSP; FPGA; TD-LTE wireless integrated testing platform; TD-SCDMA Long Term Evolution integrated testing platform; data acquisition system; downlink link processing; large-capacity uplink data acquisition; multichannel buffered serial port interface; series Virtex 5; Data acquisition; Digital signal processing; Field programmable gate arrays; Instruments; Synchronization; Testing; Wireless communication; McBSP; TD-SCDMA Long Term Evolution; Virtex-5; data acquisition;
Conference_Titel :
Multimedia Technology (ICMT), 2011 International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-61284-771-9
DOI :
10.1109/ICMT.2011.6001989
