Title :
Reflection from layered dielectric structures with combined regular and random inhomogeneities
Author :
Guzev, Michael A. ; Popov, Gennadiy V.
Author_Institution :
Inst. of Autom. & Control Process., Acad. of Sci., Vladivostok, Russia
Abstract :
Optical wave reflection from a layered half-space with regular and random inhomogeneities where the regular perturbations correspond to a linear waveguide near the half-space boundary. Random inhomogeneities are simulated in the frame of the white noise model. The problem is solved analytically in a framework of the embedding method which reduces a boundary problem to the problem with initial values considering the field as a function of the half-space boundary coordinate and obtaining then its solution as a steady-state probability density of the reflection coefficient phase. Numerical calculations revealed some features of the field behavior under the combined influence of regular and random inhomogeneities such as the reflection coefficient phase increasing inhomogeneity from uniform distribution for small regular inhomogeneities toward a strong peak at the phase equal to π/2 for increasing ones, and some fine effects which are still greater than the calculation accuracy
Keywords :
boundary-value problems; dielectric thin films; light reflection; measurement theory; optical multilayers; optical waveguide theory; optical waveguides; photonic band gap; probability; reflectivity; boundary problem; calculation accuracy; embedding method; field behavior; half-space boundary; half-space boundary coordinate; initial values; layered dielectric structures; layered half-space; linear waveguide; optical wave reflection; random inhomogeneities; reflection coefficient phase; regular inhomogeneities; regular perturbations; steady-state probability density; white noise model; Acoustic reflection; Dielectrics; Frequency; Nonhomogeneous media; Optical filters; Optical reflection; Optical waveguides; Random media; Slabs; White noise;
Conference_Titel :
Transparent Optical Networks, 1999. International Conference on
Conference_Location :
Kielce
Print_ISBN :
0-7803-5637-3
DOI :
10.1109/ICTON.1999.781881