Title :
Progress in CuInS2 submodules
Author :
Klaer, J. ; Luck, I. ; Siemer, K. ; Klenk, R. ; Bräunig, D.
Author_Institution :
Hahn-Meitner-Inst., Berlin, Germany
Abstract :
Photovoltaic devices of different size based on CuInS2 thin film absorbers have been prepared with a layer structure glass/Mo/CuInS2/CdS/ZnO. The CuInS2 absorber layers have been grown by a sequential process consisting of DC sputter deposition of copper and indium followed by sulfurization in elemental sulfur vapor. Total area efficiencies of 11.4 % and 9.4 % have been reached on 0.5 and 6.2 cm2 single cells, respectively. A 16.2 cm2 submodule with 7 integrated series connected cells on a 5×5 cm2 glass substrate reached 9.2 % efficiency under AM 1.5. The superior performance of the smaller area devices is mainly due to better fill factor while the open circuit voltage of the submodule reaches 5.1 V which is the sevenfold value of the single cell devices. A lower short circuit current of the submodule compared to single cells is due to loss of active area by the integrated series connection. Single module cells of different width without grid but with ZnO of different thickness have been used for module optimization
Keywords :
copper compounds; indium compounds; semiconductor thin films; solar cell arrays; sputter deposition; sputtered coatings; ternary semiconductors; 5 cm; 9.2 to 11.4 percent; CuInS2; CuInS2 absorber layers growth; CuInS2 submodules; CuInS2 thin film absorbers; DC sputter deposition; Photovoltaic devices; SiO2-Mo-CuInS2-CdS-ZnO; active area loss; elemental sulfur vapor; fill factor; glass substrate; glass/Mo/CuInS2/CdS/ZnO structure; integrated series connected cells; lower short circuit current; module optimization; open circuit voltage; sequential process; sulfurization; total area efficiencies; Circuits; Copper; Glass; Indium; Photovoltaic systems; Solar power generation; Sputtering; Substrates; Thin film devices; Zinc oxide;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915899