Title :
Stoichiometry control of CdTe thin film solar cells by close-spaced sublimation
Author :
Okamoto, T. ; Kitamoto, S. ; Yamada, A. ; Konagai, M.
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
The control of the native defects in the CdTe thin film solar cells was investigated by using a novel source for a close-spaced sublimation (CSS) process which was prepared by vacuum evaporation with elemental Cd and Te (evaporated source). The evaporated sources were prepared on glass substrates at room temperature, and Cd/Te ratio was controlled by varying the Cd and Te beam equivalent pressures. In the cells using the Te-rich source, the conversion efficiency was less than 0.2 % because of the extremely low shunt resistance. On the other hand, the conversion efficiency above 15 % was obtained by using the Cd-rich source. C-V characteristics revealed that the acceptor concentration in the CdTe layer increased with increasing the Cd/Te ratio of the evaporated source. Furthermore, photoluminescence spectra implied that the formation of the Cd vacancies in the CdTe layer was suppressed by using the Cd-rich source
Keywords :
II-VI semiconductors; cadmium compounds; photoluminescence; semiconductor device measurement; semiconductor device testing; semiconductor thin films; solar cells; stoichiometry; sublimation; substrates; vacuum deposited coatings; vacuum deposition; C-V characteristics; CdTe; CdTe thin film solar cells; beam equivalent pressures; close-spaced sublimation; conversion efficiency; evaporated source; glass substrates; photoluminescence spectra; shunt resistance; stoichiometry control; vacuum evaporation; Capacitance-voltage characteristics; Cascading style sheets; Glass; Photoluminescence; Photovoltaic cells; Pressure control; Substrates; Tellurium; Temperature control; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915906