Title :
Precontact surface chemistry effects on CdS/CdTe solar cell performance and stability
Author :
Albin, Dave ; Levi, Dean ; Asher, Sally ; Balcioglu, Ahmet ; Dhere, Ramesh ; Hiltner, Jason
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
Carbon-based dag pastes containing mixtures of various Cu-, Sb-, Hg-, and Bi-telluride compounds offer convenient backcontact materials for CdS/CdTe superstrate solar cells. Open-circuit stress tests at 100°C and 1.5 to 2.0 Suns illumination show that the performance of devices utilizing Cu-based pastes improves during the first 1-10 hours of stress. Of these, the best stability is exhibited by pastes containing no HgTe. Carbon-based dag pastes can be viewed as sacrificial dopant sources on properly treated CdTe surfaces. CdTe surfaces consisting of thick Te layers, resulting from nitric-phosphoric (NP) acid etches, show better incorporation of active Cu-based dopants than thinner Te layers. Deep-level transient spectroscopy (DLTS) confirms the presence of acceptor-like defects at ~Ev+0.3 eV believed to be associated with CuCd substitutional defects in NP-treated devices. The presence of Te and its ability to getter Cu is paralleled by significant improvements in CdTe device stability
Keywords :
II-VI semiconductors; cadmium compounds; deep level transient spectroscopy; semiconductor device measurement; semiconductor device testing; solar cells; stability; surface chemistry; 0.3 eV; 1 to 10 h; 100 C; CdS-CdTe; CdS-CdTe solar cell performance; CdS-CdTe solar cell stability; backcontact materials; carbon-based dag pastes; deep-level transient spectroscopy; open-circuit stress tests; precontact surface chemistry effects; sacrificial dopant sources; Chemistry; Lighting; Organic materials; Photovoltaic cells; Stability; Stress; Sun; Surface treatment; Tellurium; Testing;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.915907