DocumentCode :
3029345
Title :
Characteristics of CuInSe2 Bridgman ingots grown with sodium [solar cell manufacture]
Author :
Wang, H.P. ; Shih, I. ; Champness, C.H.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
fYear :
2000
fDate :
2000
Firstpage :
642
Lastpage :
645
Abstract :
Crystals of CuInSe2 were grown by a horizontal Bridgman method for the first time with metallic sodium. The amount of sodium was varied with levels at 0.05, 0.25 and 2 at.% approximately. However, as the sodium content was increased, the crystalline quality decreased. Hot probe measurements showed that the ingots grown with higher sodium content (0.25 and 2 at.%) were n-type, while the ingot with about 0.05 at.% was p-type. Electron probe microanalysis and an Auger profile showed no detectable sodium (i.e.<0.1 at.%) in the ingots, even up to 2 at.% added to the melt. X-ray Laue back reflection, performed on the as-grown surface of the p-type CuInSe2 ingot, confirmed the region to be single crystal. Powder X-ray diffraction patterns confirmed the chalcopyrite structure for all the ingots grown with sodium. Resistivity and carrier mobility in these ingots were obtained by Hall effect measurements. Metallic sodium was also introduced into already-grown CuInSe2 monocrystals within a sealed glass ampoule and the characteristics of these samples were also analyzed
Keywords :
Hall effect; X-ray diffraction; carrier mobility; copper compounds; crystal growth from melt; electrical resistivity; electron probe analysis; indium compounds; semiconductor device measurement; semiconductor device testing; semiconductor growth; solar cells; ternary semiconductors; Auger profile; CuInSe2; CuInSe2 solar cells; Hall effect measurements; X-ray Laue back reflection; as-grown surface; carrier mobility; chalcopyrite structure; crystalline quality; electron probe microanalysis; horizontal Bridgman growth method; hot probe measurements; powder X-ray diffraction pattern; resistivity; sealed glass ampoule; sodium content; Crystallization; Electrons; Furnaces; Glass; Hall effect; Photovoltaic cells; Powders; Probes; Voltage; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.915925
Filename :
915925
Link To Document :
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