• DocumentCode
    302940
  • Title

    Statistical estimation with 1/f-type prior models: robustness to mismatch and efficient model determination

  • Author

    Dufour, Roger M., Jr. ; Miller, Eric L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • Volume
    5
  • fYear
    1996
  • fDate
    7-10 May 1996
  • Firstpage
    2491
  • Abstract
    One common problem in signal and image processing is the determination of a discrete representation of a signal given data corresponding to a noisy and blurred version of the unknown. We examine the performance degradation associated with the use of a two-parameter family of fractal-type statistical models in a linear least squares estimator (LLSE) when the model parameters do not match those of the actual process. These models are shown to perform well under various circumstances for estimating noisy and blurred 1/f type fractals and first order Gauss-Markov (FOGM) signals. In addition we demonstrate an effective means of bounding one of the model parameters as a function of the other so as to reduce the model to a single parameter
  • Keywords
    Markov processes; fractals; least squares approximations; parameter estimation; signal representation; statistical analysis; 1/f-type prior models; LLSE; MSE; blurred 1/f type fractals estimation; discrete signal representation; first order Gauss-Markov signals; fractal type statistical models; image processing; linear least squares estimator; mean square error; mismatch robustness; model determination; model parameters; noisy 1/f type fractals estimation; performance degradation; signal processing; statistical estimation; two-parameter family; Context modeling; Covariance matrix; Degradation; Least squares approximation; Least squares methods; Robustness; Signal processing; Stochastic processes; Vectors; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 1996. ICASSP-96. Conference Proceedings., 1996 IEEE International Conference on
  • Conference_Location
    Atlanta, GA
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-3192-3
  • Type

    conf

  • DOI
    10.1109/ICASSP.1996.547969
  • Filename
    547969