Title :
Design and fabrication of a novel integrated floating-electrode-“electret”-microphone (FFEM)
Author :
Zou, Q.B. ; Tan, Z.M. ; Wang, Z.F. ; Lim, M.K. ; Lin, R.M. ; Yi, S. ; Li, Z.J.
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Inst., Singapore
Abstract :
In this study, a novel principle “electret” microphone is proposed and implemented by a single-chip fabrication technique. The microphone uses a charged floating electrode surrounded by highly insulated materials as “electret” to excite electric field. Net free-electric-charges (not “bonded” charges as in traditional electret) in the floating electrode can be easily charged by use of the “hot” electron technique, available using the so-called avalanche-breakdown technique of p+-n junction. Thus the electret microphone is rechargeable, which can greatly increase the lifetime of the microphone. Preamplifier has been on-chip integrated in a JFET type by use of ion implantation. “Electret” charges are bonded in a deep potential trap, different from that of traditional electret of which the charges are in a surface shallow potential trap, thus this microphone can operate at high temperature (high as 300°C) and has high stability and reliability. Experiments show that the prototype microphone has a 3 mV/Pa sensitivity and 2l kHz frequency bandwidth in a 1 mm ×1 mm diaphragm area. Microphone performance can be further improved by use of the optimized processes and designs. The fabrication is completely IC-compatible, hence the microphone is promising in the integrated acoustic systems
Keywords :
elemental semiconductors; integrated circuit technology; ion implantation; junction gate field effect transistors; microelectrodes; micromechanical devices; microphones; silicon; 1 mm; 21 kHz; 300 C; JFET; Si; avalanche-breakdown; charged floating electrode; free-electric-charges; integrated acoustic systems; integrated floating-electrode-electret-microphone; ion implantation; lifetime; p+-n junction; preamplifier; rechargeable; single-chip fabrication; stability; surface shallow potential trap; Bonding; Dielectrics and electrical insulation; Electrets; Electrodes; Electrons; Fabrication; Ion implantation; Microphones; Preamplifiers; Temperature sensors;
Conference_Titel :
Micro Electro Mechanical Systems, 1998. MEMS 98. Proceedings., The Eleventh Annual International Workshop on
Conference_Location :
Heidelberg
Print_ISBN :
0-7803-4412-X
DOI :
10.1109/MEMSYS.1998.659823