Title :
Characterisation of methane plasma treated carbon surfaces
Author :
Deslandes, Alec ; Jasieniak, Marek ; Ionescu, Mihail ; Shapter, Joe G. ; Quinton, Jamie S.
Author_Institution :
Smart Surface Struct. Group, Flinders Univ., Adelaide, SA
Abstract :
Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) was used to investigate the chemical nature of methane plasma treated graphite surfaces. Principle Component Analysis (PCA) was applied to the SIMS data, revealing chemical changes to the surfaces, in particular the extent of hydrogenation. The hydrogen content of the HOPG surface is observed to increase with systematic increases in power of the plasma treatment. These results are supported by Elastic Recoil Detection Analysis (ERDA) measurements that show a similar increase in hydrogen content. Scanning Tunneling Microscopy (STM) measurements provide insight into the morphological changes to the surface caused by the treatment, via investigating plasma-created features that are observed to increase in coverage with the increases in plasma power.
Keywords :
graphite; hydrogen; ion microprobe analysis; plasma materials processing; principal component analysis; scanning tunnelling microscopy; secondary ion mass spectra; surface chemistry; surface morphology; surface treatment; C; STM; carbon surfaces; elastic recoil detection analysis; graphite; hydrogenation; methane plasma treatment; principle component analysis; scanning tunneling microscopy; surface chemistry; surface morphology; time of flight secondary ion mass spectrometry; Chemical analysis; Hydrogen; Mass spectroscopy; Microscopy; Plasma chemistry; Plasma measurements; Principal component analysis; Surface morphology; Surface treatment; Tunneling; elastic recoil detection analysis; methane plasma; principle component analysis; secondary-ion mass spectrometry;
Conference_Titel :
Nanoscience and Nanotechnology, 2008. ICONN 2008. International Conference on
Conference_Location :
Melbourne, Vic.
Print_ISBN :
978-1-4244-1503-8
Electronic_ISBN :
978-1-4244-1504-5
DOI :
10.1109/ICONN.2008.4639236