Title :
The applications of concurrent simulation in the power electronics laboratory
Author_Institution :
Inst. of Drive Autom. & Ind. Devices, Univ. of Min. & Metall., Cracow, Poland
Abstract :
The paper presents a new concept of the concurrent simulation in the program of the power electronics laboratory and it pedagogical philosophy. In this method the transient analysis computer simulation is performed concurrently with practical exercises. Nonlinear power electronic circuits, variation in topology and parameters together with the control system, variety and nonideal nature of power semiconductor devices make power electronics one of the most difficult and demanding subjects in the electrical course. The proposed teaching method through experiments and concurrent simulation need to be continuously improved and the individual learning process must be eagerly encouraged. In order to use the method effectively the laboratory arrangements and software must fulfil certain requirements. The presented application examples demonstrate to students that in certain conditions simulation and practical experiment results are consistent. In conclusion, the author tries to determine to what degree the computer prediction can represent the true behaviour of the power electronics circuit and what needs to be done in order to improve the accuracy of the simulation
Keywords :
circuit analysis computing; computer aided instruction; electronic engineering education; laboratories; power electronics; power semiconductor devices; student experiments; transient analysis; computer simulation; concurrent simulation; control system; individual learning process; nonlinear power electronic circuits; power electronics circuit behaviour; power electronics education; power electronics laboratory; power semiconductor devices; topology variation; transient analysis; Application software; Circuit simulation; Circuit topology; Computational modeling; Computer simulation; Control systems; Laboratories; Nonlinear control systems; Power electronics; Transient analysis;
Conference_Titel :
Industrial Electronics, 1996. ISIE '96., Proceedings of the IEEE International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
0-7803-3334-9
DOI :
10.1109/ISIE.1996.551006