• DocumentCode
    3029801
  • Title

    Atomic force microscopy for industry with the Akiyama-Probe sensor

  • Author

    Stücklin, Stephan ; Gullo, Maurizio R. ; Akiyama, Terunobu ; Scheidiger, Martin

  • Author_Institution
    Nanosurf AG, Liestal
  • fYear
    2008
  • fDate
    25-29 Feb. 2008
  • Firstpage
    79
  • Lastpage
    82
  • Abstract
    For atomic force microscopy (AFM) to extend its usefulness into routine industry applications, its operation needs to be simplified. This paper shows how the novel Akiyama-Probe has been integrated in a commercial AFM to significantly simplify probe exchange.
  • Keywords
    atomic force microscopy; probes; sensors; AFM; Akiyama-probe sensor; atomic force microscopy; industry; probe exchange; Atomic force microscopy; Feedback loop; Force sensors; Industry applications; Manufacturing industries; Probes; Surface finishing; Surface topography; Tunneling; Vibrations; Akiyama-Probe; atomic force microscopy; ease of use; industry; quartz tuning fork;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscience and Nanotechnology, 2008. ICONN 2008. International Conference on
  • Conference_Location
    Melbourne, Vic.
  • Print_ISBN
    978-1-4244-1503-8
  • Electronic_ISBN
    978-1-4244-1504-5
  • Type

    conf

  • DOI
    10.1109/ICONN.2008.4639250
  • Filename
    4639250
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3029801