• DocumentCode
    3029840
  • Title

    Automatic classification of node types in switch-level descriptions

  • Author

    Blaauw, David T. ; Banerjee, P. ; Abraham, Jacob A.

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • fYear
    1990
  • fDate
    17-19 Sep 1990
  • Firstpage
    175
  • Lastpage
    178
  • Abstract
    In switch-level simulation, nodes carry a charge on their parasitic capacitance from one evaluation to the next, which gives them a memory quality. A node is classified as temporary if its memory aspect is lost and cannot affect the circuit operation, whereas a node is classified as a memory node if the memory of the node is maintained and can affect the circuit operation. Accurate classification of nodes into temporary and memory nodes increases the performance of compiled simulators and high-level model generators. An approach for reliable automatic classification of nodes in a switch-level description is introduced. Both an exhaustive, exponential-time algorithm and a polynomial-time heuristic are presented. The heuristic was implemented and tested for several large circuits, including a commercial microprocessor. For this processor, the proposed heuristics identified an average of 92% of all nodes as temporary nodes. The heuristic was applied in a high-level model generator and significantly increased its performance
  • Keywords
    circuit analysis computing; computational complexity; digital simulation; exponential-time algorithm; heuristic; high-level model generators; memory nodes; node types; parasitic capacitance; polynomial-time heuristic; switch-level descriptions; switch-level simulation; temporary nodes; Capacitance measurement; Circuit simulation; Circuit testing; Joining processes; Maintenance; Parasitic capacitance; Polynomials; Size measurement; Switched capacitor circuits; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1990. ICCD '90. Proceedings, 1990 IEEE International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-2079-X
  • Type

    conf

  • DOI
    10.1109/ICCD.1990.130194
  • Filename
    130194