• DocumentCode
    3029996
  • Title

    Adaptive Pattern Matching Grammar Generation for Use in Deep Packet Inspection

  • Author

    Menon, Govind ; Katdare, Sanchit ; Phatak, Sagar ; Khengare, Rahul

  • Author_Institution
    Univ. of Pune, Pune, India
  • fYear
    2011
  • fDate
    16-18 Nov. 2011
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    Deep Packet Inspection (DPI) is becoming more widely used in virtually all applications or services like Denial of Service (DoS), Intrusion Detection System (IDS) etc. that operate with or within a network. However for a developer or team working on any network project who need to perform DPI, there is always the issue of using a third party source which may involve added cost or implementing it themselves which requires time and study of protocols, signatures and the nuances of pattern matching. The paper proposes a solution to the above problem using an adaptive grammar generation algorithm. This method reduces the entropy among similar results given by different patterns. Immense customizability is the foremost advantage of this method. Existing grammars for new signatures can be combined into a single grammar easily rather than new grammars be generated from raw target strings. The paper, thus, looks to limit the detailed knowledge requirement for the design of signature detection procedures and in doing so re-use existing procedures which have been thoroughly debugged and tested.
  • Keywords
    grammars; pattern matching; security of data; DPI; DoS; IDS; adaptive grammar generation; adaptive pattern matching; deep packet inspection; denial of service; entropy; immense customizability; intrusion detection system; signature detection procedure; Educational institutions; Entropy; Grammar; Inspection; Pattern matching; Production; Protocols; Deep Packet Inspection; Grammar; Pattern Matching; Regular Expressions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Modeling and Simulation (EMS), 2011 Fifth UKSim European Symposium on
  • Conference_Location
    Madrid
  • Print_ISBN
    978-1-4673-0060-5
  • Type

    conf

  • DOI
    10.1109/EMS.2011.74
  • Filename
    6131199