DocumentCode :
3030078
Title :
Recent research trends in gate engineered tunnel FET for improved current behavior by subduing the ambipolar effects: A review
Author :
Bagga, Navjeet ; Sarkhel, Saheli ; Sarkar, Subir Kumar
Author_Institution :
Dept. of Electron. & Telecommun. Eng., Jadavpur Univ., Kolkata, India
fYear :
2015
fDate :
15-16 May 2015
Firstpage :
1264
Lastpage :
1267
Abstract :
The gradual progress in the development of a Tunnel Field Effect transistor as a suitable alternative to conventional Metal Oxide Semiconductor Field Effect Transistor for achieving superior current performance in nanoscale low power device has been considered in this review. Beginning from a simple p-i-n reverse biased diode, we have tried to cover various recently developed gate engineered TFET structures in terms of their current behavior to show that by cleverly engineering the gate electrode, TFETs with superior current characteristics can be realized. Apart from this, we have also presented a concise discussion on the problem and possible solution of ambipolarity in TFETs, thereby making the use TFETs with low leakage current possible in complimentary digital circuits.
Keywords :
field effect transistors; leakage currents; nanoelectronics; p-i-n diodes; tunnel transistors; ambipolar effects; complimentary digital circuits; gate electrode; improved current behavior; low leakage current; metal oxide semiconductor field effect transistor; nanoscale low power device; p-i-n reverse biased diode; tunnel FET; tunnel field effect transistor; Field effect transistors; Logic gates; P-i-n diodes; Silicon; Tunneling; Ambipolarity; Doping-less; Double gate; Subthreshold slope; Tunnel FET; Work function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computing, Communication & Automation (ICCCA), 2015 International Conference on
Conference_Location :
Noida
Print_ISBN :
978-1-4799-8889-1
Type :
conf
DOI :
10.1109/CCAA.2015.7148569
Filename :
7148569
Link To Document :
بازگشت