• DocumentCode
    3030468
  • Title

    An analytical method for the 3D-location estimation of circular features for an active-vision system

  • Author

    Safaee-Rad, R. ; Smith, K.C. ; Benhabib, B. ; Tchoukanov, I.

  • Author_Institution
    Toronto Univ., Ont., Canada
  • fYear
    1990
  • fDate
    4-7 Nov 1990
  • Firstpage
    215
  • Lastpage
    220
  • Abstract
    A closed-form analytical solution to the circular-feature problem, which arose in the context of a 3-D object recognition system, is presented. Compared to previous methods, it is mathematically simpler, provides a solution for the case in which there does not exist a priori knowledge concerning the radius of a marker, and can be extended and applied to general quadratic surfaces. In addition, the method is clearer from a geometrical viewpoint. The method was applied to a set of circles, located on a calibration plate, whose locations were known with respect to a reference frame. The camera was calibrated prior to the application of the method. Since various distortion factors had to be compensated in order to obtain accurate estimates of the parameters of the imaged circle, an ellipse, with respect to the camera´s image frame, a sequential compensation procedure was applied to the input grey-level image. Experimental results showing the validity of the method are reported
  • Keywords
    calibration; compensation; parameter estimation; pattern recognition; 3-D object recognition system; 3D-location estimation; active-vision system; calibration plate; circular features; closed-form analytical solution; ellipse; general quadratic surfaces; input grey-level image; parameter estimation; pattern recognition; sequential compensation; Algebra; Cameras; Closed-form solution; Computer integrated manufacturing; Educational institutions; Geometry; Iterative methods; Laboratories; Mechanical engineering; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 1990. Conference Proceedings., IEEE International Conference on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    0-87942-597-0
  • Type

    conf

  • DOI
    10.1109/ICSMC.1990.142095
  • Filename
    142095